Developing a New Optimization Model Based on the Process Yield Index     and the Process Capability Index     for Resubmitted lots 

Document Type : Original Article

Authors

1 Department of Industrial Engineering, Yazd University, Yazd, Iran; 

2   Department of Industrial Engineering, Yazd University, Yazd, Iran;   

Abstract
 Acceptance sampling plan is a useful tool for assurance and quality control in industries. In this paper, the resubmitted sampling plan is developed based on the process yield index     and the process capability index     by considering the minimum angle method. The plan parameters are determined by minimizing the ASN and satisfying the conformity to the ideal operating characteristic (OC) curve as well as the producer’s and customer’s risk, simultaneously. In addition, the performance of the proposed plan is evaluated on the basis of two indices and compared with the single sampling plan. The research results show that the proposed plan based on the index     is more economical because by increasing the similarity of the proposed plan’s OC curve to the ideal OC curve, the proposed plan based on the index     performs better than the proposed plan based on the index     in terms of ASN. The applicability of the proposed sampling plan is illustrated with a numerical example. 
 

Keywords


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